W-2810MR Oscillator Perturbation Test System

  • Automated, software-based oscillator, VCXO and TCXO temperature test system
  • Measures frequency over temperature
  • Parameter and curve fit characteristics are checked against easy to define QC limits
  • Oscillators of different frequencies can be tested in a single temperature run
  • All data is published in a Microsoft Access™ database
  • Data can be exported to Microsoft Excel™ for custom data analysis
  • Oscillator part number can be used to set complete measurement parameters, QC limits, temperature test points and data printouts
  • Electronic switching
  • High speed frequency measurement
  • Complete frequency perturbation testing of 512 parts in about 1.5 hours
  • Chamber holds eight 64-position measurement boards for a total of 512 parts
  • Socket PCBs available include 2.0x2.5, 2.5x3.2, 3.2x5, 3.5x6, 5x7, 5x7.5, 9x14, DIP (full & half)
  • Measurement boards available for LVDS, PECL, ECL, CMOS, and TTL devices
  • Sub PPB measurement

SPECIFICATIONS

Oscillator Frequency Range: 10 KHz to 1 GHz
Temperature Stability: ±0.1°C
Temperature Uniformity: ±0.6°C
Temperature Range: -55°C to 85°C (MR)
-65°C to 85°C (MR with LN2 Boost)

SYSTEM CONFIGURATION

  • S&A 4350MR Option 1 Temperature Test Chamber
  • Eight position card cage and backplane PCB
  • Frequency Counter
  • DUT Power Supply
  • Computer
  • S&A MFC-100 Card
  • National GPIB Card
  • Windows® based System Software

SAMPLE REPORTS