W-2810MR Oscillator Perturbation Test System
- Automated, software-based oscillator, VCXO and TCXO temperature test system
- Measures frequency over temperature
- Parameter and curve fit characteristics are checked against easy to define QC limits
- Oscillators of different frequencies can be tested in a single temperature run
- All data is published in a Microsoft Access™ database
- Data can be exported to Microsoft Excel™ for custom data analysis
- Oscillator part number can be used to set complete measurement parameters, QC limits, temperature test points and data printouts
- Electronic switching
- High speed frequency measurement
- Complete frequency perturbation testing of 512 parts in about 1.5 hours
- Chamber holds eight 64-position measurement boards for a total of 512 parts
- Socket PCBs available include 2.0x2.5, 2.5x3.2, 3.2x5, 3.5x6, 5x7, 5x7.5, 9x14, DIP (full & half)
- Measurement boards available for LVDS, PECL, ECL, CMOS, and TTL devices
- Sub PPB measurement
SPECIFICATIONS
Oscillator Frequency Range: | 10 KHz to 1 GHz |
Temperature Stability: | ±0.1°C |
Temperature Uniformity: | ±0.6°C |
Temperature Range: | -55°C to 85°C (MR) -65°C to 85°C (MR with LN2 Boost) |
SYSTEM CONFIGURATION
- S&A 4350MR Option 1 Temperature Test Chamber
- Eight position card cage and backplane PCB
- Frequency Counter
- DUT Power Supply
- Computer
- S&A MFC-100 Card
- National GPIB Card
- Windows® based System Software