W-2800B SMD Disc Pallet Oscillator Temperature Test System
- Automated, software-based oscillator, VCXO and TCXO temperature test system
- Measures over 50 different tests
- Precision time interval analysis of oscillator startup characteristics
- Parameter and curve fit characteristics are checked against easy to define QC limits
- Oscillators of different frequencies can be tested in a single temperature run
- All data is published in a Microsoft Access™ database
- Data can be exported to Microsoft Excel™ for custom data analysis
- Oscillator part number can be used to set complete measurement parameters, QC limits, temperature test points and data printouts
- Chamber holds four disc palletsfor a total of up to 512 parts
- Standard SMD sizes available include 2.0x2.5, 2.5x3.2, 3.2x5, 3.5x6, 5x7, 5x7.5, 9x14, DIP (full & half)
- Measures LVDS, PECL, ECL, CMOS, and TTL devices
- Load circuitry easily changed via plug-in module
SPECIFICATIONS
Oscillator Frequency Range: | 10 KHz to 1 GHz |
Oscilloscope Analog Bandwidth: | 600 MHz (rise time 1% error at 5 nsec) |
Oscillator X10 Probe Bandwidth: | 1 KHz to 850 MHz (2.5 K Ohm Max Impedance) |
Oscillator X50 Probe Bandwidth: | 1 KHz to 500 MHz (12.5 K Ohm Max Impedance) |
Temperature Stability: | ±0.1°C |
Temperature Uniformity: | ±0.6°C |
Temperature Range: | -55°C to 125°C (MR or LCO2) -65°C to 125°C (LN2) |
SYSTEM CONFIGURATION
- S&A Probe Test Head
- S&A 4220 Temperature Test Chamber (LCO2, LN2 or MR option)
- Oscilloscope
- 20A Power Supply
- Printer (optional)
- Computer (minimum Pentium III, 2 PCI slots, 1 full size PCI slot)
- S&A MFC-100 Card (requires full size PCI slot)
- GPIB Card
- Windows® based System Software