W-2200 SMD Disc Pallet Temperature Test System

With 250B-1 or 250C Network Analyzer

  • Automated software based quartz crystal temperature test system
  • Up to 2 disc pallets can be stacked
  • Standard SMD sizes available include:
    SMD Type Disc Capacity Total Chamber Capacity
    5 x 7mm 140 280
    4.5 x 8mm 140 280
    3.5 x 6mm 160 320
    3.2 x 5mm 160 320
    2.5 x 4mm 160 320
    2.5 x 3.2mm 160 320
    2.0 x 2.5mm 160 320
    HC-49USMD 100 200
    LEADED HC-45/49 100 200
  • Custom SMD sizes available
  • Disc pallet platform can be easily integrated into
    dedicated machine for automatic
    loading / unloading SMD devices
  • Measures over 75 different tests
  • Parameter and curve fit characteristics checked against easy to define QC limits
  • Crystals of different frequencies tested in a single temperature run
  • All data published in a Microsoft Access™ database and can be exported to Microsoft Excel™ for custom data analysis
  • Printouts are generated using Crystal Reports®
  • Dual chamber configuration available

SPECIFICATIONS

250B-1 Frequency Range: 15 KHz to 220 MHz
250C Frequency Range: 15 KHz to 500 MHz
Frequency Correlation: ± 1 ppm at series, typical *
Crystal power: 1 nW to 1000 uW (1 MHz to 50 MHz)
1 nW to 500 uW (>50 MHz to 200 MHz)
Temperature Stability: ± 0.1° C
* Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.

SYSTEM CONFIGURATION

  • S&A 250B-1 or 250C Network Analyzer
  • S&A 2451 Switch Controller
    (only required in dual chamber configuration)
  • S&A 4220 Temperature Test Chamber
    (LCO2, LN2, or Mechanical Refrigeration Cooling)
  • IEC-444 Pi-Network Test Head
  • Windows® based System Software
  • Printer (Optional)
  • Computerr Requirements:
    Minimum 500 MHz Pentium III, One full PCI slot with +3.3V & 5V power, Windows 98®

SAMPLE REPORTS