W-2200 Bench Top Temperature Test System
- Automated, software-based quartz dual crystal temperature test system
- Measures over 75 different tests
- Two crystal capacity
- Parameter and curve fit characteristics
are checked against easy to define QC limits - Precision Crystal Temperature Perturbation Analysis
- Example Perturbation Test:
- - 40° C to +105° C
- Over 1000 temperature points
- Total test time of 45 minutes
for SMD crystals
- Available test fixtures holding two SMD devices:
- 2x2.5mm, 2.5x3mm, 3.2x5mm
- 3.5x6mm, 5x7mm
- HC-49U, HC-49SMD, HC-49SMD-LP
- Custom
- All data is published in a Microsoft Access™ database
- Data can be exported to Microsoft Excel™ for custom data analysis
- Printouts are generated using Crystal Reports®
SPECIFICATIONS
| 250B Frequency Range: | 15 KHz to 220 MHz |
| 250C Frequency Range: | 15 KHz to 500 MHz |
| Frequency Correlation: | ± 1 ppm* at series (typical) |
| Crystal Power: | 1 nW to 1000 uW (1 MHz to 50 MHz) 1 nW to 500 uW (>50 MHz to 200 MHz) |
| Temperature Range: | - 40° C to +105° C @ 25° C Ambient |
| Temperature Stability: | ± 0.1° C |
| * Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment. | |
SYSTEM CONFIGURATION
- S&A 250B-1 or 250C Network Analyzer
- S&A 4310 Bench Top Temperature Test Chamber
- Dual IEC-444 Pi-Network Test Head
- S&A PCI TTL I/O CARD
- Windows® based System Software
- Printer (Optional)
- Computer Requirements:
Minimum 500 MHz Pentium III, One full PCI slot with +3.3V & 5V power, Windows XP ®
SAMPLE REPORTS
