W-2500 Diode Test System

  • Automated, software driven temperature test system for diodes and other discrete passive components
  • Typical testing applications are sampling test, final Q.C. test, and new component evaluation
  • Test wheels accommodate axial, surface mount and chip diodes, in addition to many special geometry type devices
  • Selectable test parameters with user defined Q.C. limits
  • Exports measurement data in real time to Microsoft Excel for custom data analysis
  • Easy to use Windows 95 Graphical User Interface (GUI) software
  • Fully configurable graphical and tabular printouts
  • Sharing of test results via network


Voltage Measurements: Equipment Specific (not to exceed 250VDC)
Current Measurements: Equipment Specific
Temperature Range: -55 C to 150 C
Temperature Stability: +/- 0.1 degree C
* Subject to specification of LCR bridge


  • Forward Voltage
  • Reverse Leakage Current
  • Breakdown Voltage
  • Zener Voltage


  • Computer
  • S&A 4220 temperature test chamber (CO2, LN2, or Mechanical Refrigeration)
  • Voltage/Current Source Meter
  • High Voltage Power Supply
  • Digital Multimeter
  • System software
  • Printer (optional)