W-2200B Dual Chamber Temperature Test System
With 250B-1 or 250C Network Analyzer
- Automated software based quartz crystal temperature test system
- Measures over 75 different parameters
- Parameter and curve fit characteristics are
checked against easy to define QC limits - Crystals of different frequencies can be
tested in a single temperature run - All data published in a Microsoft Access™
database and can be exported to Microsoft Excel™
for custom data analysis - Crystal part number can be used to set
complete measurement parameters, QC limits,
temperature test points, and data printouts - Printouts are generated using Crystal Reports®
- Accommodates two dual row test wheels
with extended life test head contacts - Easily loaded S&A proprietary sockets accept
HC-45, HC-49, HC-43, HC-49US, HC-18, SMD and tubular
type packages - Typically holds 1016 devices per run
SPECIFICATIONS
250B-1 Frequency Range: | 15 KHz to 220 MHz |
250C Frequency Range: | 15 KHz to 500 MHz |
Frequency Correlation: | ± 1 ppm at series, typical * |
Crystal power: | 1 nW to 1000 uW (1 MHz to 50 MHz) 1 nW to 500 uW (>50 MHz to 200 MHz) |
Temperature Stability: | ± 0.1° C |
* Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment. |
SYSTEM CONFIGURATION
- S&A 250B-1 or 250C Network Analyzer
- Two S&A 2451 Switch Controllers
- Two S&A 4220 Temperature Test Chambers
(LCO2, LN2, or Mechanical Refrigeration Cooling) - Two IEC-444 Pi-Network Test Heads
- Windows® based System Software
- Printer (Optional)
- Computerr Requirements:
Minimum 500 MHz Pentium III, One full PCI slot with +3.3V & 5V power, Windows 98®
SAMPLE REPORTS
