W-2200 Low Frequency Crystal Disc Pallet Temperature Test System
- Automated software based quartz crystal temperature test
system for low frequency crystals
- Up to 2 disc pallets can be stacked
- Standard sizes available include:
Type |
Disc Capacity |
Total Chamber Capacity |
DST-520 DST-621 |
160 |
320 |
DMX-26 DMX-26-S |
160 |
320 |
DMX-38 |
100 |
200 |
SM-26F-A SM-26F-B |
160 |
320 |
SM-14-J |
160 |
320 |
LEADED |
100 |
200 |
- Custom sizes available
- Typical watch crystal measurement time
of only 2 seconds
- Measures over 75 different parameters
- Parameter and curve fit characteristics checked against easy to define QC limits
- Crystals of different frequencies can be tested in a single temperature run
- All data published in a Microsoft Access™ database and can be exported to Microsoft Excel™ for custom data analysis
- Printouts are generated using Crystal Reports®
- Dual chamber configuration available
SPECIFICATIONS
150K Ohm Test Head Frequency Range: |
10 KHz to 400 KHz |
Frequency Correlation: |
± 1 ppm at series, typical * |
Crystal power: |
1 nW to 1 uW into 20,000 Ohms |
Temperature Stability: |
± 0.1° C |
* Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment. |
SYSTEM CONFIGURATION
- S&A 250B-1 or 250C Network Analyzer
- S&A 2451 Switch Controller
(only required in dual chamber configuration)
- S&A 4220 Temperature Test Chamber
(optional LCO2, LN2 or Mechanical Refrigeration Cooling)
- S&A 150K Ohm Test Head
- Windows® based System Software
- Printer (Optional)
- Computerr Requirements:
Minimum 500 MHz Pentium III, One full PCI slot with +3.3V & 5V power, Windows 98®
SAMPLE REPORTS