W-2220MR Crystal Temperature Test System
- Industry’s first crystal temperature test system with 100% electronic switching
- Proprietary 50 ohm reflection network provides typical frequency measurement repeatability < 0.02 ppm !
- High speed, high precision frequency measurement using calculated FL over temperature
- Chamber holds eight 64-position pallet socket DUT PCBs for a total of 512 parts
- Crystals of different frequencies can be tested in a single temperature run
- Parameter and curve fit characteristics are checked against easy to define QC limits
- All data is published in a Microsoft Access™ database
- Printouts are generated using Crystal Reports®
- Data can be exported to Microsoft Excel™ for custom data analysis
SPECIFICATIONS
| 250B-1 Frequency Range: | 1 MHz to 220 MHz |
| 250C Frequency Range: | 1 MHz to 500 MHz |
| Frequency Correlation: | ± 1 ppm at series, typical * |
| Frequency Repeatability: | < 0.02 ppm (typical) |
| Temperature Stability: | ± 0.1° C |
| Temperature Range: | -55° C to 125° C (MR) -65° C to 125° C (MR with LN2 Boost ) |
| * Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment. | |
SYSTEM CONFIGURATION
- S&A 250B-1 or 250C Network Analyzer
- S&A 4350MR Option 1 Temperature Test Chamber
- Eight position card cage and backplane PCB
- 50 Ohm Reflection Networks
- Windows® based System Software
- Computer
- Printer (Optional)
SAMPLE REPORTS
