W-2200B Disc Pallet Dual Chamber Temperature Test System

With 250B-1 or 250C Network Analyzer

  • Automated software based quartz crystal temperature test system
  • Holds up to 1280 devices per run
  • Standard sizes available include:
    Type Disc Capacity Total Chamber Capacity
    SMD 5 x 7mm 140 560
    SMD 4.5 x 8mm 140 560
    SMD 3.5 x 6mm 160 640
    SMD 3.2 x 5mm 160 640
    SMD 2.5 x 4mm 160 640
    SMD HC-49USMD 100 400
    LEADED HC-45/49 100 500
  • Custom SMD sizes available
  • High speed fan mounted inside the chamber cover provides fast temperature soak time
  • Disc pallet platform can be easily integrated into S&A 901A machine for automatic unloading / loading SMD devices
  • Measures over 75 different parameters
  • Parameter and curve fit characteristics checked against easy to define QC limits
  • Crystals of different frequencies tested in a single temperature run
  • All data published in a Microsoft Access™ database and can be exported to Microsoft Excel™ for custom data analysis
  • Printouts are generated using Crystal Reports®

SPECIFICATIONS

250B-1 Frequency Range: 15 KHz to 220 MHz
250C Frequency Range: 15 KHz to 500 MHz
Frequency Correlation: ± 1 ppm at series, typical *
Crystal power: 1 nW to 1000 uW (1 MHz to 50 MHz)
1 nW to 500 uW (>50 MHz to 200 MHz)
Temperature Stability: ± 0.1° C
Example Throughput: 5 temperature points (-20 0 25 50 85)
1200 parts per hour
* Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.

SYSTEM CONFIGURATION

  • S&A 250B-1 or 250C Network Analyzer
  • Two S&A 2451 Switch Controllers
  • Two S&A 4220 Temperature Test Chambers
    (LCO2, LN2, or Mechanical Refrigeration Cooling)
  • Two IEC-444 Pi-Network Test Heads
  • Windows® based System Software
  • Printer (Optional)
  • Computerr Requirements:
    Minimum 500 MHz Pentium III, One full PCI slot with +3.3V & 5V power, Windows 98®

SAMPLE REPORTS