SAUNDERS & ASSOCIATES, INC.  6300341-00  SAMPLE REPORTS  •  Computer Requirements: Minimum 500  MHz Pentium III, one full PCI slot with +5V     
& 3.3V power, and Windows 98  •  Windows System Software  •  Printer (Optional)  SYSTEM CONFIGURATION  •  S&A 250B Network Analyzer  •  S&A 2451 Switch controller  (only required in dual chamber configuration)  •  S&A 4220 Temperature Test Chamber  (optional LCO₂   LN₂    or  Mechanical  Refrigeration  Cooling)  •  S&A 150K Ohm Test Head

 S&A           W-2200 LOW FREQUENCY CRYSTAL
DISC PALLET TEMPERATURE TEST SYSTEM  •  Automated, software based quartz crystal  temperature test system for low frequency crystals  •  Up to 2 disc pallets can be stacked  •  Standard sizes available include:  •  Custom sizes available  •  Typical watch crystal measurement time
of only 2 seconds  •  Measures over 75 different parameters  •  Parameter and curve fit characteristics are checked
against easy to define QC limits  •  Crystals of different frequencies can be tested in a
single temperature run  •  All data is published in a Microsoft Access  T M  data base  •  Data can be exported to Microsoft Excel  T M  for     custom data analysis  •  Printouts are generated using Crystal Reports  T M  •  Dual chamber configuration available  TYPE        DISC CAPACITY      TOTAL CAPACITY/ PER CHAMBER  DST-520, DST-621  160  320  DMX-26, DMX-26-S  160  320  DMX-38  100  200  SM-26F-A, SM-26F-B  160  320  SM-14-J  160  320  Leaded  100  200  150K Ohm Test Head
Frequency Range:  10 KHz to 400 KHz  Frequency Correlation:  +/-  1 ppm* at series (typical)  Crystal power:  1 nW to 1 uW into 20,000 Ohms  Temperature Stability :    ±0.1 Degree C  *  Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.  SPECIFICATIONS