SAUNDERS & ASSOCIATES, INC.  6300231-02  SYSTEM CONFIGURATION  SAMPLE REPORTS  •  250B or 250C Network Analyzer  •  S&A 2451 Switch Controller  (only required in dual chamber configuration)  •  S&A 4220 Temperature Test Chamber  (LCO₂, LN₂, or Mechanical Refrigeration  Cooling)  •  IEC-444 Pi-Network Test Head  •  Windows System Software  •  Printer (Optional)  •  Computer Requirements:  Minimum 500 MHz Pentium III
One full PCI slot with +3.3V & 5V power,
Windows 98

 S&A  •  Accommodates dual row test wheel
with extended life test head contacts  •  Easily loaded S&A proprietary sockets
accept HC-45, HC-49, HC-43, HC-49US,
HC-18, SMD and tubular type packages  •  Typically holds 254 devices per run  •  Dual Chamber configuration available    •  Automated, software-based quartz  crystal temperature test system  •  Measures over 75 different tests  •  Parameter and curve fit characteristics
are checked against easy to define QC  limits  •  Crystals of different frequencies can be
tested in a single temperature run  •  All data is published in a Microsoft Access  T M  data base  •  Data can be exported to Microsoft Excel  T M  for custom data analysis  •  Printouts are generated using Crystal Reports  •  Crystal part number can be used to set complete measurement parameters, QC
limits, temperature test points, and data printouts  *  Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.  W-2200 TEMPERATURE  TEST SYSTEM  With 250B or 250C Network Analyzer  SPECIFICATIONS  250B Frequency Range:  15 KHz to 400 KHz and 0.5 MHz to 200 MHz  250C Frequency Range:  15 KHz to 400 KHz and 0.5 MHz to 500 MHz  Frequency Correlation:  +/- 1 ppm* at series (typical)  Crystal power:  1 nW to 1000 uW (1 MHz to 50 MHz)
1 nW to 500 uW (>50 MHz to 200 MHz)  Temperature Stabili ty:    ±0.1 Degree C