Saunders
Ion Beam Etching
Graphical Display
 SYSTEM CONFIGURATION    Direct Drive Roughing Pump    Light Pole    System Software    Elevator Subsystem    Computer    Network Analyzer    Cryo Pump    Ion Gun  6300238-00  FACILITY REQUIREMENTS    Power: 208VAC  3-Phase, 7KVA, 50/60 Hz     Inlet Pressure: 90-100 PSIG
Air: 90 - 100 PSIG
Nitrogen: 70 - 100 PSIG
Process Gas: 10 PSIG
Dimensions W 53" x D 37" x H 88"
 Software screen measurements
SAW final frequency distribution
Frequency Adjustment System
Transport Boat
5911 Saw Wafer Frequency Adjustment System
 Throughput:  Device Dependent  S&A  5911 SAW WAFER FREQUENCY  ADJUSTMENT SYSTEM          SPECIFICATIONS    Elevator subsystem continuously handles two
magazines
   Each magazine holds five transport boats    Transport boat carries two 100 mm wafers    Wafers are continuously loaded, etched, and
unloaded
   User specified etching times are communicated to
the system via network,  RS-232 or floppy disk in a
text file format
   Selective Ion Beam etching of 100 mm wafers
to improve SAW final frequency distribution
   Wafer is divided into 256 etching areas.  Each
area is etched for a user specified time
   Continuous wafer motion during the etching
process provides a smooth etching profile
   Frequency change is made by etching the
wafer material at a much faster rate than the
aluminum electrodes
 Transport Boat  (bottom view)
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