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This document provides typical specifications for single crystal cultured quartz multi-high humbered bar quartz, grown on Z-plate seeds and lumbered into several uniformly dimensioned bars. The individual as-grown crystals are crystallographically oriented and lumbered with several cuts in the YZ plane; thus producing equal sized lumbered bars, as shown below. In this process, the "top", "centre" and "bottom" bars differ slightly in that while the centre bars are pure-Z material, both the top (+X direction) and bottom (-X direction) bars contain a small quantity of +X or -X material, respectively. This non-Z material is, in all cases, limited to a thickness not to exceed 2.0 mm. Seed material in tops, centres and bottoms is centred in the Z direction within a 3.0 mm wide band.
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|
Units |
Typical
Values |
Tolerance |
|
X-height
x Z-width |
mm |
10.0
x 20.0 |
± 0.13 |
|
mm |
9.5
x 19.0 |
± 0.13 |
||
mm |
9.0
x 18.0 |
± 0.13 |
||
Y-Iength |
mm |
200 |
± 5 |
|
| Orientation of X-surface | @
Y-axis |
degrees |
0 |
± 15 minutes |
@
Z-axis |
degrees |
0 |
± 15 minutes |
|
| Orientation of Z-surface | @
X-axis |
degrees |
0 |
± 1 degree |
@
Y-axis |
degrees |
0 |
± 1 degree |
|
| Flatness of -X lumbered surface | mm |
Flat |
± 0.1 |
|
| Flat Surface finish of -X lumbered surface, Ra | µm |
4.0 |
maximum |
| Handedness | Right |
||||
| Infrared α (3500 cm-1) | α
-units |
Grade B: 0.045 |
Maximum |
||
Grade C: 0.060 |
|||||
Grade II |
Grade I |
||||
| Inclusions (diameter) | 25-75 µm |
cm3 |
5 |
4 |
Maximum |
75-100 µm |
cm3 |
4 |
2 |
Maximum |
|
>100 µm |
cm3 |
3 |
2 |
Maximum |
|
| Etch channels | cm2 |
Grade 4: 300 |
Maximum |
||
| Twins and cracks in useful volume | Count |
None |
| Seed centricity |
Within central 3 mm |
|
| Non-Z material | +X growth |
2.0 mm maximum |
-X growth |
2.0 mm maximum |
International
Electrotechnical Commission Standard,
CEI/IEC 758, Second edition, 1993-04.
Institute of
Electrical and Electronic Engineers
Standard on Piezoelectricity,
ANSI / IEEE Std. I 76~l 987.