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Lumbered D Bars

This document provides typical specifications for single crystal cultured quartz material grown on a Z-plate seed and lumbered so as to simplify the cutting of wafers for the family of doubly rotated crystals operating in the thickness shear mode. The additional rotation is about the Z-axis and is designed to reduce the effects of stress on resonant frequency.

Lumbered D Bars are manufactured such that doubly rotated blanks are easily obtained when the D-bar is wafered using procedures similar to those used to fabricate AT-cut blanks. The φ - rotation (i.e. the first, or X to X´, rotation), nominal values of which are typically around 22° for bars used to make SC-cut blanks and 19° for IT-cuts, is provided as shown. The θ - rotation (i.e. the second, or Z to Z´, rotation) is delivered when the bar is wafered, the primary difference between AT wafering and this θ - rotation being a slight reduction in the cutting angle.

Section Drawing
Lumbered D Bars

Mechanical Characteristics

Description
Units
Typical Values
Tolerance
X´-height x Z-width
mm
13.3x12.7
± 0.13
   
16.5x15.2
± 0.13
   
17.8x16.5
± 0.13
Y´-Iength
mm
63.5
+ 2.5, -0
Orientation of X´-surface @ Z-axis
degrees
0
± 15 minutes
Orientation of Z-surface @ X´-axis
degrees
0
± 15 minutes
@Y´-axis
degrees
0
± 15 minutes
Flatness of -X´ lumbered surface
mm
Flat
± 0.1
Surface finish of -X´ lumbered surface, Ra
µm
4.0
maximum
Dimensions above are standard. Other dimensions are available to meet customer specific requirements

Material Characteristics

Handedness  
Right
   
Infrared α (3500 cm-1)
α - units
Grade B: 0.045
 
maximum
   
Grade ll
Grade l
 
Inclusions (diameter)  
25 - 75 µm 
cm3
5
4
maximum
 
75 - 100µm 
cm3
4
2
maximum
 
>100µm 
cm3
3
2
maximum
Etch Channels
cm2
Grade 4 : 300
 
maximum
Twins and Cracks in Useful Volume
Count
None
   

Seed Characteristics

Pure - Z, seed free material

Marking and Packaging

 

 

 

References

International Electrotechnical Commission Standard, CEI/IEC 758, Second edition, 1993-04.

Institute of Electrical and Electronic Engineers Standard on Piezoelectricity, ANSI/IEEE Std. 176-1987.

 

©Vides.Web Roditi International 2004 Reproduced by kind permission of Sawyer Research Products, Inc.© Sawyer Research Products, Inc. Specifications subject to change without notice.All rights reserved