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This document provides typical specifications for single crystal cultured quartz material grown on a Z-plate seed and lumbered so as to simplify the cutting of wafers for the family of doubly rotated crystals operating in the thickness shear mode. The additional rotation is about the Z-axis and is designed to reduce the effects of stress on resonant frequency.
Lumbered D Bars are manufactured such that doubly rotated blanks are easily obtained when the D-bar is wafered using procedures similar to those used to fabricate AT-cut blanks. The φ - rotation (i.e. the first, or X to X´, rotation), nominal values of which are typically around 22° for bars used to make SC-cut blanks and 19° for IT-cuts, is provided as shown. The θ - rotation (i.e. the second, or Z to Z´, rotation) is delivered when the bar is wafered, the primary difference between AT wafering and this θ - rotation being a slight reduction in the cutting angle.
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| Description | Units |
Typical Values |
Tolerance |
| X´-height x Z-width | mm |
13.3x12.7 |
± 0.13 |
16.5x15.2 |
± 0.13 |
||
17.8x16.5 |
± 0.13 |
||
| Y´-Iength | mm |
63.5 |
+ 2.5, -0 |
| Orientation of X´-surface @ Z-axis | degrees |
0 |
± 15 minutes |
| Orientation of Z-surface @ X´-axis | degrees |
0 |
± 15 minutes |
| @Y´-axis | degrees |
0 |
± 15 minutes |
| Flatness of -X´ lumbered surface | mm |
Flat |
± 0.1 |
| Surface finish of -X´ lumbered surface, Ra | µm |
4.0 |
maximum |
| Dimensions above are standard. Other dimensions are available to meet customer specific requirements | |||
| Handedness | Right |
||||
| Infrared α (3500 cm-1) | α - units |
Grade B: 0.045 |
maximum |
||
Grade ll |
Grade l |
||||
| Inclusions (diameter) |
25 - 75 µm |
cm3 |
5 |
4 |
maximum |
| |
75 - 100µm |
cm3 |
4 |
2 |
maximum |
| |
>100µm |
cm3 |
3 |
2 |
maximum |
| Etch Channels | cm2 |
Grade 4 : 300 |
maximum |
||
| Twins and Cracks in Useful Volume | Count |
None |
|||
Pure - Z, seed free material
International Electrotechnical Commission Standard, CEI/IEC 758, Second edition, 1993-04.
Institute of Electrical and Electronic Engineers Standard on Piezoelectricity, ANSI/IEEE Std. 176-1987.
©Vides.Web Roditi International 2004 Reproduced by kind permission of Sawyer Research Products, Inc.© Sawyer Research Products, Inc. Specifications subject to change without notice.All rights reserved