SAUNDERS & ASSOCIATES, INC.  6300347-00  •  Computer  (minimum Pentium III, 4 PCI slots)  •  TTL I/O Card     •  Frequency Counter Card  •  GPIB Card  •  System Software  •  Printer (optional)  SYSTEM CONFIGURATION  •  FET Probe Test Head  •  S&A 4220 Temperature Test Chamber  (LCO₂, LN₂   or  MR  option)  •  Oscilloscope  •  Voltmeter / Power Supply Card  (requires full size PCI slot)  •  20A Power Supply  SAMPLE REPORTS

 S&A            W-2800 OSCILLATOR
TEMPERATURE TEST SYSTEM  SPECIFICATIONS  Frequency Range:  10 KHz - 400 MHz  Temperature Stability:  ± 0.1 Degree C  Temperature Range:  -55 Degrees C to 125 degrees C (MR or LCO₂)
-65 Degrees C to 125 degrees C (LN₂)  •   Standard four row test wheel
holds 196 devices and accepts
8-pin or 14-pin device packages
and SMD test sockets  •  Measures ECL, TTL, CMOS, HMOS  
and 3.3 V & 5 V devices with
square wave and sine wave outputs  •  Load circuitry easily changed
via plug-in module  •  Automated, software-based oscillator  VCXO and TCXO temperature test system  •  Measures over 50 different tests  •  Parameter and curve fit characteristics
are checked against easy to define
QC limits  •  Oscillators of different frequencies can be
tested in a single temperature run  •  All data is published in a  Microsoft Access^TM  data base  •  Data can be exported to Microsoft Excel ^T M
for custom data analysis  •  Printouts are generated using Crystal Reports  •  Oscillator part number can be used to set complete measurement parameters,
QC limits, temperature test points and data printouts