S&A  VARIABLE CAPACITANCE LOAD CARD  TEMPERATURE TEST HEAD  6300209-01  •  Variable capacitance load card test   
head  for crystal temperature test
systems  •  Load card DIP switch selects either FR or FL      measurement  •  FL measurement physical capacitance can be
set from 5 to 37 pF  in 0.5 pF steps  •  Integral moisture barriers support  repeatable FL testing  •   Design optimized for correlation to industry  standard test equipment  Quad Disc Test Head  Dual Row Test Head  Variable Capacitance Load Card