•  Quality Factor  •  Trim Sensitivity  (of load resonant frequency)  •  Power Level  •  Capacity Ratio  •  Insulation Resistance  •  Drive Level Dependency  •  Spurious Testing  •  Others  •  Software for Measurement
and Pass/Fail Testing  •  Printer (Optional)  •  Feed Bowl and Stand (Optional)  •  Series Resonant Frequency  •  Load Resonant Frequency  (for specified load capacitance)  •  Load Capacitance  (for specified load resonant frequency)  •  Shunt Capacitance  •  Motional Capacitance  •  Motional Inductance  •  Resistance  •  250B Network Analyzer  •  IEC-444 Pi-Network  •  Computer  •  Eleven Bin Sorting  6300208-04  SYSTEM CONFIGURATION  MEASUREMENTS  SCREEN FORMATS  SAUNDERS & ASSOCIATES, INC.

 S&A        350C SMD CRYSTAL
TEST AND SORT SYSTEM  •  Linear in/out SMD crystal test and sort system  •  Supports S&A 250B Network Analyzer with   
Windows system software  •  Vacuum pick-up mechanism can easily
accommodate different SMD packages, such
as 5x7mm, 3.5x6mm, 3.2x5mm and customer
defined packages  •  Process flow: Linear input track? IR test
station? RF test station? binning station?
unloading station? linear output track  •  Crystals travel down the feed track to loading
station where each part is lifted by vacuum
pick-up and placed in the adjacent test station  IR Port  Insert
Assembly  Frequency Range:  1 MHz - 200 MHz  Frequency Correlation:  ± 2 ppm at series, typical *  Crystal Power:  1 nW - 1  mW  into 25 ohms, typical  *  Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.  •  Pick and place rotary table transfers parts
from loading station to the IR and RF test
stations where crystal parameters are
measured  •  At binning station, reject or good crystals
can be sorted into bins  •  Good crystals advance to the linear
output track via unloading station  •  Generates and prints statistical and
distribution data  SPECIFICATIONS