6300139-06  MEASUREMENTS  •  Quality Factor  •   Trim Sensitivity  •   Power Level  •   Capacity Ratio  •   Drive Level Dependency  •   Spurious Testing  •   Others  •  Series Resonant Frequency  •   Load Resonant Frequency  •   Load Capacitance  •   Shunt Capacitance  •   Motional Capacitance  •   Motional Inductance  •   Resistance  •  System accommodates two
SMD  pallets per run  •  SMD standard sizes include
5 x 7mm, 5 x 7.5mm, and
3.5 x 6mm  •  Custom sizes available  Metal pallet for 3.5 x 6mm  surface mount crystals

 S&A  610B CRYSTAL TEST  SYSTEM  •  Automated, software based testing of
SMD crystals held in S&A pallets  •  Gross leak Detection Capability - Data
Comparison  Function reports frequency
difference between first and second
measurement runs.  A large frequency
difference indicates a potential gross leak
problem.  •  Performs repeatable PASS/FAIL testing to
easily defined limits  •  Automatically adjusts to easily defined  power levels  •  Broadband calibration  •  Displays and prints statistical and
distribution data  S&A    610C  Frequency Range:  1 MHz - 180 MHz  (300 MHz Optional)  Frequency Correlation:  ± 2  ppm at series,  typical *  Crystal Power:  0.01 ? W  - 1000   ? W
into 25 ohms  Crystal Termination:  IEC-444 Standard
Pi Network  SPECIFICATIONS  *  Proprietary measurement and calibration algorithms provide correlation to  industry standard crystal measurement equipment.