6300130-07  MEASUREMENTS  SYSTEM CONFIGURATION  SAUNDERS & ASSOCIATES, INC.  •  Power:  220 Volts @ 30 A or 380 Volts @ 20 A, 3-Phase  •  Inlet Pressures:  150 PSIG Maximum  •  Air:  90 PSIG  •  Nitrogen:  20 PSIG (Turbo), 70 PSIG (Cryo)  •  Cryo Water Cooling:  0.5 GPM @70 ° F, typical  •  Dimensions:  52.5 x 34.5 x 55 Inches (excluding light pole &  cryo   compressor) (133.4 x 87.6 x 139.7cm)
Cryo pump compressor 19.5 x 24 x 19 inches
(49.2 x 61 x 48.3 cm) Light pole 39.5 inches (100.3 cm)  FACILITY REQUIREMENTS  •  Motional Capacitance  •  Motional Inductance  •  Trim Sensitivity  •  Quality Factor  •  Plateback  •  Series Resonant Frequency  •  Load Resonant Frequency  •  Resistance  •  Shunt Capacitance  •  Light Pole  •  System Software  •  Closed Loop Water Cooled  Filament  •  Bar Code Reader (Optional)  •  Printer (Optional)  •  Digital High Drive (Optional)  •  Vector Voltmeter  •  Dual Output Synthesizer  •  X-Y Table Assembly  •  Turbo or Cryo Pump  •  Direct Drive Roughing Pump  •  Computer

 •  Quartz wafer final adjust plating   
system for AT strip resonators
contained on a single quartz wafer  •  Plates crystals on two wafers
simultaneously  •  Typical component tray holds four  wafers  •  Measured parameters are checked
against easy to define Q.C. limits after
each crystal is plated  S&A  5511B QUARTZ WAFER  PLATING SYSTEM  SPECIFICATIONS  Frequency Range:  3 MHz - 300 MHz  Plating Performance :  ± 2  ppm  typical final frequency  •  Precise X-Y table positioning  •  Supports any wafer size and resonator
array requirement  •  Measurement data can be saved to
disk and/or printed