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Ambient Temperature Test
Temperature Test
Ageing Test

Oscillator Temperature Test Systems

2210
T.C. System for TCXO and VCXO Leaded and SMD oscillators
The devices to be tested are placed in a flat rectangular XY array. Ideal systems for automatic load and unload of oscillators. Uses the Model 66222 rectangular chamber. Same measurement capabilities as 2400 system. Frequency measurements to over 1GHz and full waveform measurements to devices over 200MHz
2212
T.C. System for OCXO, TCXO and VCXO SMD oscillators
The system uses the model 66322 chamber. The chamber has built in DUT power supplies, 6 each 80W and 3 each 20W programmable power supplies. There are power supplies for the multiplex control circuits. Options include the ability to power OCXOs as well as the lower power oscillators. The DUT multiplexing has excellent flexibility, this chamber is ideally suited to test and program the various types of TCXO designs that are digitally and analog programmed. The most flexible test system option - many configurations available. The system supports the 2210 system test cards
2400
T.C. System for VCXOs, TCXOs, TCVCXO, and clock oscillators
Round chamber with the oscillators mounted in a round drum test wheel. Includes waveform measurement capabilities. The system consists of an oscilloscope, counter, DMM, power supplies and chamber. The most capable system in a round chamber, with the highest measurements bandwidth