Digitizing Oscilloscope (modified to have counter outputs) Several scope types will work. Tektronix TVS 625 1 GHz Bandwidth, VXI digitizer, DMM, VXI frame and VXI-GPIB Slot 0 Controller
Tektronix TDS3052 500MHz Bandwidth
Tektronix TDS724 500MHz Bandwidth with jitter measuring capabilities
Tektronix TDS784 1GHz Bandwidth with jitter measuring capabilities
Tektronix TDS 820 6 GHz Bandwidth
Frequency Counter: GT-654 (Time Interval Analyzer)
System Controller/Computer with GPIB interface and color monitor
Printer: HP LaserJet
Handler (handlers are custom configured to the specified package): Both handler types can be configured for SMT or leaded parts
Exatron 2000 2 tubes manual feed
8 tubes output ----- OR ----- Exatron 5000 2 tubes manual feed --- or --- 8 tubes auto feed --- or --- vibratory bowl feed
8 tubes output --- or ---
5 tubes output with automatic tape and reel
Laser marking with CO2 or YAG laser
Plunge to test, minimizes lead lengths
Particle interconnect for SMT parts using the Plunge to Test feature Handler Interface system: Test sight load cards for TTL/CMOS and limited ECL testing
Analog I/O and TTL I/O computer expansion card
Interface electronics: Remote sensing programmable power supplies (Vcc, Auxiliary [pin #1] and Vload)
16 lines of isolated control signals to the test head
DUT current sensing
All necessary cabling
Operating software
System manuals including operation procedures and maintenance information
Example testing procedures. Up to 10 procedures if appropriate DUT specification information supplied Low Cost Option: Special system option, use the PRA Model 1020 bench tester with the remote interface option to perfor testing and
sorting. CUSTOMER MUST SUPPLY: AC Power (50 to 60 Hz) from 90 to 130 VAC or 190 to 260 VAC at 750 VA. User must indicate nominal voltage and system will be set to that nominal voltage +/-10%
System has an isolation transformer that is tapped to the specific user needs
Compressed dry air from 80 PSI (56g/mm2)(5.6Bars) to 100 PSI (70g/mm2)(7.0Bars) 2470System MEASUREMENT EQUIPMENT NOTE: PRA Inc. reserves the right to make changes to the product contained in this data sheet in order to improve the design or performance
and to supply the best possible product. PRA Inc. reserves the right to make these changes without notice. Revised 9/1/02
Data Printing, Storing and Statistics All the measured data can be stored to the
controllers hard disk. This data can be printed
later or used by other programs for additional
data analyses. The measurements can also be accumu-
lated into 1 of a possible 25 categories. This
distribution data can be very useful for process
control functions. All measured data is displayed on the screen.
This is only for information and test program
debugging purposes. The screen also shows if the
device passes or fails and which track the part will
be sorted into. All of the measured data can be printed. The
user can select to print all DUTs, only the failed
DUTs or only the pass DUTs.
2470C System Block Diagram normally used to power the DUT load circuit. The waveform characteristics are measured
at user programmable threshold values. The
values can be specified as absolute voltages or as
a % of the measured amplitude. The system
measures rise time, fall time, duty cycle and
logic levels of the waveform. The oscillator start time can be tested. The
oscilloscope triggers on the user set point on the
Vcc signal and the envelope of the DUT output
is measured on the oscilloscope. The system can also measure the DUT’s
starting voltages. These are the voltages between
which the oscillator will operate correctly. The user sets the voltage range to be scanned. These
limits can be very significant in insuring the
clock oscillators will operate and start correctly
over temperature. VCXOs can be tested for pull ability be-
tween voltages or linearity. For the linearity test
the system measures the oscillators frequency
versus voltage function at user specified voltage
points. The data is then curve fit and the % error
from the curve fit is computed. All measured parameters can have limits
placed on the value and then the user assigns
which bin to place the failed part in. All mea-
sured parameters can be accumulated in 1 of 25
statistical categories.
The DUT test sight has a load card that is
held in place with 2 screws. The load card is
made to the users testing specification. TTL,
HCMOS and 50 ohm loads are typical types
available. Custom load cards can be designed for
specific needs. Changing time for the load cards
is about 15 minutes. The oscilloscope probes are placed as close
to the DUT outputs as possible. This lets the
system make optimum use of the 1GHz band-
width of the oscilloscope. The short lead lengths
helps minimize ringing of the measured wave-
forms. The system can measure dual output oscil-
lators. The signals do not need to be related in
frequency or level. The system has 3 supply voltages. These
supplies have ±11 volt range, setting resolution <0.01mV, >100mA capacity and have remote
sensing. The Vcc and Auxiliary supply can be
programmed for slew rate, with a range of 0.1 to
100,000 volts per second. The DUT can then be
tested at various supply application rates. The signals to the test head permit testing
devices with nominal 15 volt supply. The test
head has a -5volt fixed supply available. The Vcc supply is used to power the DUT.
The current supplied by this power supply can
also be measured. This would be the DUT supply
current. The Auxiliary supply is intended to bias pin
#1. This is used in Enable/Disable, Tri-State and
VCXO testing. The Vload supply can be set to a fixed
5.00v, 3.0v, 2.5v, 0.0v, -2.0v, -5.2v or track
Vcc or the Auxiliary supply. This supply is Test and Measurements Performed J.M. Ney contacts PCB with load
circuit for the
DUT Frame to hold the
DUT load card
and scope probe
to the handler Power supply
connection to the
PRA Model 2470
Handler interface Tek Scope probe Test Sight Location viewed from the chassis bottom
Bin for Tape and Reel Transfer parts to tape Sealing position 5 Bins for tubes Laser marking position Tape supply Laser write
position DUT position
for testing DUT movement control
solenoids Input tube carrier,
8 positions Remove screws to
expose the DUT test
position
SYSTEM FEATURES This is a system to measure large quantities of
quartz crystal DIP/DIL and SMT clock oscillators.
The system has the following key features: •Equipmentandsoftwareoptimizedforspeed of test. • DUT handling is done with an Exatron Inc.
handler. The Model 2000 and 5000 handling sys-
tems can be used. Each handler is made by Exatron
to precisely handle the specified parts. • All test parameters are stored in a simple to
edit ASCII text file. •All entered test procedures are stored on the
system controller's hard disk. To test an already
defined part requires the operator to select the
desired specification from a menu. Then press the
[C] key to begin testing. • The system uses a digitizing oscilloscope to
measuretheDUT'soutputwaveform.TheTektronix
TVS625 is a VXI bus based very fast 1GHz band- width digitizer. This unit can digitize a complete waveform and return the results to the computer in less than 300 mSec. •ThecounterisafastTimeIntervalAnalyzer.
Thispermitsmeasuringoscillatorstarttimes,VCXO
response times as well as frequency. • Statistical distribution data can be kept and
accumulated on all measurements. This data can be
veryusefulinproductassuranceeffortsandprocess control. • A user defined percentage of parts can be tested with a more Extensive Test. The Extended
Test is usually more lengthy but provides additional
process control information with minimal impact
onsystemthroughput. • The system software has check out sections
to perform calibration and confirm proper opera-
tion. FEATURES: • Can sort into 5 or 8 categories.
• Wide bandwidth system: 1GHz Bandwidth scope for high speed testing 6GHz Bandwidth scope for ultimate bandwidth • Typically >3000 DUTs per hour with TVS625 (no laser marking or plunge to test)
• Tape and Reel optional
• Laser Marking optional
•Measurements: Rise and Fall time Duty Cycle '1' and '0' Level Start time (frequency and amplitude) Multiple Supply Voltages VCXO pull ability and linearity Set Supply Voltage Slew Rate Test at different loads Enable/Disable Testing Tri State Output Tests • Statistical presentation of all test data Exatron 2000 Handler
Model 2470C
Clock Oscillator Sorter Test System Frequency and Waveform Measurements
TTL, CMOS, ECL and Sine Wave Oscillators Exatron 2000 Handler
Tek TDS 820 Scope
Sort to 8 Tubes
Manual Tube Input Exatron 5000 Handler
Laser Marking (multi images)
Tek TVS 625 Digitizer
Tape and Reel Out and
Sort to 5 Tubes
Auto 8 Tube Input
