6300184.03  SYSTEM CONFIGURATION  •  Computer  •  S&A 4220 temperature test
chamber (CO2, LN2, or Mechanical
refrigeration)  •  Voltage/Current Source Meter  •  High Voltage Power Supply  •  Digital Multimeter  •  System software  •  Printer (optional)  MEASUREMENTS  OUTPUT FORMATS  •  Forward Voltage  •  Reverse Leakage Current     •  Breakdown Voltage  •  Zener Voltage

 S&A                       2500 DIODE
TEMPERATURE TEST SYSTEM  •  Automated, software driven
temperature test system for diodes
and other discrete passive
components  •  Typical  testing  applications are
sampling test, final Q.C. test, and
new component evaluation  •  Test wheels accommodate axial,
surface mount and chip diodes, in
addition to many special geometry
type devices  SPECIFICATIONS  Voltage Measurements:               Equipment Specific (not to exceed 250VDC)  Current Measurements:                                   Equipment Specific
Temperature Range:                                         -55 C to 150 C
Temperature Stability:                                       +/- 0.1 degree C  •  Selectable test parameters with user defined
QC limits  •  Exports measurement data in real time to
Microsoft Excel for custom data analysis  •  Easy to use Windows 95 Graphical User
Interface (GUI) software  •  Fully configurable graphical and tabular
printouts  •  Sharing of test results via network  Diode Test Wheel