6300183.04  SYSTEM CONFIGURATION  •  Computer  •  S&A 4220 temperature test
chamber (CO2, LN2, or Mechanical
Refrigeration)  •  LCR Bridge  MEASUREMENTS  •  Power Supply (for IR option)  •  Current  Meter (for IR option)  •  System software  •  Printer (optional)  OUTPUT FORMATS  •  Capacitance (Cs, Cp)  •  Inductance (Ls, Lp)  •  Series Resistance (Rs)  •  Dissipation Factor (DF)  •  Quality Factor (Q)  •  Conductance (G)  •  Reactance (X)  •  Impedance  (Z)  •  Insulation Resistance *(optional)  •  Temperature Coefficients  •  Variation with Temperature  Note: Availability of measurements varies with LCR bridge functions
* IR maximum range is 10  Tera Ohms at 50 VDC

 S&A                2500 CAPACITOR
TEMPERATURE TEST SYSTEM  •  Automated, software driven temperature
test system for capacitors and other
discrete passive components  •  Typical testing applications are sampling
test, final Q.C. test, and new component
evaluation  •  Open and short circuit socket calibration,
isolated carriers, Kelvin contacts and
shielded cables for accurate
measurements  SPECIFICATIONS  Capacitance Range:                                                5 pF to 2 F typical*
Temperature Range:                                               -55 C to 150 C
Temperature Stability:                                            +/- 0.1 degree C  •  Selectable test parameters with user defined Q.C.
limits  •  Exports measurement data in real time to Microsoft
Excel for custom data analysis  •  Easy to use Windows 95 Graphical User Interface
(GUI) software  •  Fully configurable graphical and tabular printouts  •  Sharing of test results via network  •  Test wheels accommodate axial, radial, and chip capacitors and many other special
geometry type devices  * Subject to specification of LCR bridge  Teflon-isolated  Chip Carrier